FEG LV-SEM – JEOL JSM-IT800(HL)

The field emission (FEG) SEM is a first pass analysis tool for characterising mineral/mineral processing problems on a variety of samples.  The instrument can operate in two different modes: 

• high vacuum – for ultimate resolution and enables full elemental quantification,  

• low vacuum – minimal sample preparation for imaging and qualitative analysis

At a glance:

• Low Vacuum (LV) System (10-300 Pa) 
• JEOL EDS (60mm²)
• Inert specimen transfer airlock, for analysing air-sensitive materials (e.g. reactive metals).
• DEBEN motor insertion PMT based fast CL detector