FEG EPMA – JEOL 8530F

JEOL 8530F Electron microprobe

The JEOL JXA-8530F Field Emission Gun Electron Probe Micro-Analyser (FEG-EPMA) is our flagship instrument for x-ray mapping and microanalysis. It has high elemental sensitivity (~10-100) ppm, depending on phase abundance) and has broad elemental sensitivity (Li-U).

At a glance:

• 4 WDS spectrometers
• JEOL soft x-ray emission spectroscopy (SXES) spectrometer with JS50XL and JS200N gratings
• 2 Bruker Xflash 6010 silicon drift detector energy dispersive spectrometers (SDD-EDS)
• xClent hyperspectral CL detection system (UV to IR, spectral resolutions)
• Large stage allowing for specimens up to 100mm × 100mm
• Cryogenic mapping stage for minimising damage of beam-sensitive materials, and to reduce thermal broadening of CL and SXES peaks in high-resolution spectroscopic studies.
• Inert specimen transfer airlock, for analysing air-sensitive materials (e.g. reactive metals, chlorides, fluorides, etc​​​​​​​).
• Plasma cleaning system

Common applications

• Large-area mapping of mineral ores and concentrates, including identification of mineral species, and quantification of composition.
• Valuable and penalty element deportment characterisation for mineral separation and processing, including tracking changes in phase abundance, phase composition, and trace element concentrations.
• Corrosion/reaction studies of alloys, electrochemical electrodes, furnace refractories, and other industrial products.
  High-resolution mapping of fine-textured minerals and synthetic materials.

This instrument is funded through an ARC Linkage Infrastructure, Equipment and Facilities (LIEF) grant, LE130100087. The consortium partners were: Monash University, RMIT University, Swinburne University, The University of Melbourne, and the CSIRO.