FEG EPMA – JEOL iHP200F

The JEOL iHP200F Field Emission Gun Electron Probe Micro-Analyser (FEG-EPMA) is our flagship instrument for x-ray mapping and microanalysis. It has high elemental sensitivity (~10-100) ppm, depending on phase abundance) and has broad elemental sensitivity (Be-U).

At a glance:

• 5 WDS spectrometers
  • 3 L-type spectrometers
  • 1 H-type spectrometer
  • 1 4-crystal spectrometer
• Soft x-ray emission spectroscopy (SXES) spectrometer
• Integrated JEOL EDS
• xClent hyperspectral CL detection system 
  • Wide range UV to IR spectrometer 
  • High resolution optical CL spectrometer with multiple gratings and motorised aperture. 
• Large stage allowing for specimens up to 100mm × 100mm
• Cryogenic mapping stage for minimising damage of beam-sensitive materials, and to reduce thermal broadening of CL and SXES peaks in high-resolution spectroscopic studies.
• Inert specimen transfer airlock, for analysing air-sensitive materials (e.g. reactive metals, chlorides, fluorides, etc​​​​​​​).
• Plasma cleaning system

Common applications

• Critical mineral characterisation with emphasis on rare-earth analysis.
• Large-area mapping of mineral ores and concentrates, including identification of mineral species, and quantification of composition.
• Valuable and penalty element deportment characterisation for mineral separation and processing, including tracking changes in phase abundance, phase composition, and trace element concentrations.
• Corrosion/reaction studies of alloys, electrochemical electrodes, furnace refractories, and other industrial products.
  High-resolution mapping of fine-textured minerals and synthetic materials.