FEG EPMA – JEOL 8500F

The JEOL JXA-8500F Field Emission Gun Electron Probe Micro-Analyser (FEG-EPMA) provides for x-ray mapping and microanalysis. It has high elemental sensitivity (~10 ppm depending upon element) and has broad elemental sensitivity (Be-U).

 

At a glance:

• ​​​​​​​5 WDS spectrometers
• 2 Bruker XFLASH 6010 silicon drift detector energy dispersive spectrometers (SDD-EDS)
• xClent hyperspectral CL detection system(UV to IR, spectral resolutions)
• Plasma cleaning system
• Optically encoded stage with 0.02 micron resolution
• Large stage allowing for specimens up to 100mm × 100mm
• Transmitted light stage and optics
• Qualitative and quantitative mapping using either beam or stage stepping
• Elemental analysis from Beryllium to Uranium
• Liquid nitrogen trap for light element analysis

Common applications

• Large-area mapping of mineral ores and concentrates, including identification of mineral species, and quantification of composition.
• Valuable and penalty element deportment characterisation for mineral separation and processing, including tracking changes in phase abundance, phase composition, and trace element concentrations.
• Corrosion/reaction studies of alloys, electrochemical electrodes, furnace refractories, and other industrial products.
• High-resolution mapping of fine-textured minerals and synthetic materials.